Available on request
Other Special Phased Array Probes
Custom Doppler phased-array probes for difficult or application-specific inspection geometries.
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Array probes with secondary-axis focusing for concentrated sound fields and fine-defect sensitivity.
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Final specifications, commercial terms, lead time, and documentation are confirmed against your application.
Array probes with secondary-axis focusing for concentrated sound fields and fine-defect sensitivity.
Catalogue reference: Doppler 2026 Product Manual, page 17.
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